Scanning Probe Microscopy is a key technology for the characterization of the nature of the surface of a sample. Until now, it has been generally accepted that one needs one instrument for one measurement. Surface science and technology are in  great need of one instrument that can perform the characterization of all kind of near field interactions.
 
Our patented technology revolutionizes standard Scanning probe microscopy by uncoupling the interaction sensor and the probe itself. Thanks to our solutions it is now easy to change the nature of the tip and the interaction that it can detect, our instruments offer the possibility to fully characterize the surface properties of your sample by using a universal, versatile and simple to use instrument. With a UPI instrument, it is now possible to measure multiple type of interactions in a broad range of environment.

UPI proposes a universal sensor and there is no limitation in the interaction probe one can imagine. Indeed, size does not matter and there is no issue in integrating any kind of probe on our instruments